We are proud to announce that Harshdeep Singh and Niraj Prasad Bhatta, esteemed members of the SMART Lab at Wright State University, have been recognized for their exceptional thesis work during Chip Industry Week.
Harshdeep Singh’s thesis, titled “AI-Enabled Hardware Security Approach for Aging Classification and Manufacturer Identification of SRAM PUFs,” has been featured in the latest edition of “Chip Industry Week in Review” by Semiconductor Engineering. Additionally, Niraj Prasad Bhatta’s thesis, “ML-Assisted Side Channel Security Approaches for Hardware Trojan Detection and PUF Modeling Attacks,” has also received notable recognition.
These acknowledgments are a testament to the dedication and hard work of both students over the past two weeks. Their innovative research contributions are paving the way for advancements in the semiconductor industry.
We extend our deepest gratitude to our advisor and the entire Computer Science and Engineering Department at Wright State University for their invaluable guidance and support.