We are proud to share our participation in the IEEE PAINE conference in Huntsville, Alabama. The event provided a platform to engage with distinguished individuals and scholars from across the globe. Our presentation highlighted workforce development initiatives at Wright State University and collaborations with AFRL-ADMETE and NPS-NSA.
Additionally, we shared pioneering research from the SMART Lab on Reliable and Trusted PCBs to combat counterfeits and secure COTS against Hardware Trojan modification attacks. The presentation sparked numerous insightful questions and genuine interest in the ongoing work.
We extend sincere gratitude to our colleagues and collaborators, including Navid Asadi, Ujjwal Guin, Aydin Aysu, P. Len Orlando III, Erin Gawron-Hyla, Pauline Paki, Salman Nasir, and others. We look forward to reconnecting with everyone at next year’s IEEE PAINE conference.
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